Relation Between Measurement System Capability and Process Capability
Relation Between Measurement System Capability and Process Capability
- Publication:
- Quality Engineering
- Date:
- September 1996
- Issue:
- Volume 9 Issue 1
- Pages:
- pp. 95-98
- Author(s):
- Persija, Marcel, Van Nuland, Yves
- Organization(s):
- Ghent, Belgium, Blanden, Belgium,
Abstract
[This abstract is based on the author's abstract.]
Measuring Cpk of product characteristics is not enough. It is also necessary to know the capability of the measuring system. When the ratio of product variability to measuring error becomes less than three, the process is no longer in control, but tracking the measuring instrument. The application of a new measurement index (MI) is explained through an example.
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