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More Pitfalls of Accelerated Tests

More Pitfalls of Accelerated Tests

Publication:
Journal of Quality Technology
Date:
July 2013
Issue:
Volume 45 Issue 3
Pages:
pp. 213-222
Author(s):
Meeker, William Q., Sarakakis, Georgios, Gerokostopoulos, Athanasios,
Organization(s):
Iowa State University, Ames, IA, Tesla Motors, Palo Alto, CA, ReliaSoft Corporation, Tucson, AZ

Abstract

[This abstract is based on the authors' abstract.]As product-development cycles become shorter and companies demand more rapid achievement of reliability goals, it is becoming more and more important to use quantitative accelerated life tests (ALT) to predict and improve reliability. Today there is an abundance of methods to plan and analyze accelerated tests, but there are also many pitfalls. This paper identifies some major problems and concerns in conducting and interpreting the results of accelerated tests. We identify various pitfalls, such as using an equal unit allocation at all levels of an accelerating variable, using unnecessarily complex testing and data analysis schemes, attempting to predict life from a HALT, using ALT at the system level, not having adequate time to- failure information, using extreme extrapolation, ignoring the impact of idle

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