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Measure for Measure: Calculating Uncertainty

Measure for Measure: Calculating Uncertainty

Publication:
Quality Progress
Date:
July 2014
Issue:
Volume 47 Issue 7
Pages:
pp. 44-45
Author(s):
Grachanen, Christopher L.
Organization(s):
Hewlett-Packard Co., Houston, TX

Abstract

In metrological circles, there are many different statistics and figures of merit used to gauge the quality of measurement data. Of course, the well-accepted statistics of standard deviation and variance are routinely used to determine the variability of measurement data as well as to assign distributions to data to define the likelihood that these data fall within an expected interval or span.

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