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Storage Reliability

by John Rooney

A Classic Article of Reliability which covers a discussion of the effects of prolonged storage on components. it presents models to estimating the reliability after storage...

  • Filetype: pdf
  • Publish date: 2010-06
  • Keywords:non-operating, one-shot devices

Reliability Estimation for One-Shot Systems with Zero Component Test Failures

by Sharon Honecker; Huairui Guo; Doug Ogden; Adamantios Mettas;

In this paper, a flexible and practical method is designed
to est..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, one-shot devices

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