Library
Human Rating of Launch Vehicles: Historical and Potential Future Risk
Approaches..
- Filetype: pdf
- Publish date: 2011-01
- Keywords:Conceptual Design, Design Reliability, Product Reliability, Quality Assurance, RAMS 2011 Proceedings, Systems Engineering
Analyzing Interconnection Design Safety Using Bent Pin Analysis
Low-tech hazards can cause catastrophic results in safety- critical and other systems...
- Filetype: pdf
- Publish date: 2011-01
- Keywords:Design Review, Design Reliability, Fault Tree Analysis, Product Reliability, Quality Assurance, RAMS 2011 Proceedings, Reliability Model, Systems Engineering
An Optimization Approach for Safety Instrumented System Design
In chemical and process industry SISs are applied to keep under control dangerous processes..
- Filetype: pdf
- Publish date: 2011-01
- Keywords:RAMS 2011 Proceedings, Systems Engineering, Quality Assurance, Design Reliability
Assessing The Fire Risk For A Historic Hangar
In the early 1930s the Naval Air Station Sunnyvale,California was commissioned to house the USS Macon, a U.S. Naval Airship. It is now part of a Historic District consisting of a large number of buildings that were constructed from the 1930s on...
- Filetype: pdf
- Publish date: 2010-01
- Keywords:RAMS 2010 Proceedings, Product Reliability, Systems Engineering,
Potential application of FORM and SORM for PRA
“The preliminary design phase of any program is key to its eventual successful development”. [3] It is important to include structural failures as initiating events within a PRA for aeronautical or space systems...
- Filetype: pdf
- Publish date: 2010-01
- Keywords:RAMS 2010 Proceedings, Product Reliability, Systems Engineering, Reliability Model
Integrated Risk Sensitivity Study for Lunar Surface Systems
To bring the Presidential Vision for Space Exploration to fruition, NASA is developing new vehicles, capabilities, and supporting technologies that will enable sustained human and robotic exploration of the Moon, Mars, and beyond...
- Filetype: pdf
- Publish date: 2010-01
- Keywords:RAMS 2010 Proceedings, Product Reliability, Systems Engineering, Reliability Model
