Library

An Overview of Reliability Engineering

by Dr. Wei Huang

ASQ RD Chinese Webinar Series..

  • Filetype: mp4
  • Publish date: 2012-08
  • Keywords:Webinar in Mandarin, Accelerated Life Testing, reliability basics, Reliability Growth

Understanding HALT Application in Desktop, Notebook, and Server (了解HALT在桌面电脑、笔记本电脑、和服务器系统中的运用)

by Danny LS Huang;Gerald Chang;Jimmy Yang

Recorded webinar, presented in Mandarin..

  • Filetype: mp4
  • Publish date: 2012-03
  • Keywords:Webinar in Mandarin, Accelerated Life Testing

Accelerated Testing in Product Development (加速试验在产品开发中的运用)

by Dr. Loon Ching Tang

Presented in Mandarin..

  • Filetype: mp4
  • Publish date: 2011-10
  • Keywords:Webinar in Mandarin, Accelerated Life Testing, Product Development, Sample Size

An Introduction to ALT Planning by Rong Pan

by Rong Pan

Chinese webinar:Accelerated life tests (ALTs) are employed to generate failure time data at higher-than-normal-use stress levels...

  • Filetype: mp4
  • Publish date: 2011-08
  • Keywords:Webinar, Mandarin, Accelerated Life Testing, Design of experiments, Data analysis

An Introduction to ALT Planning -PPT

by Rong Pan

PowerPoint Slides for Chinese webinar: Accelerated life tests (ALTs) are employed to generate failure time data at higher-than-normal-use stress levels...

  • Filetype: pdf
  • Publish date: 2011-08
  • Keywords:Webinar, Mandarin, Accelerated Life Testing, Design of experiments, Data analysis

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

A Study Of Scaling Effects On DRAM Reliability

by Mark White, PhD; Joseph B. Bernstein, PhD; Jin Qin, PhD;

Research of scaling effects on microelectronics reliability becomes more important for space and hi-reliability users as technology continues to advance at deep submicron levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality

by Zhengzheng Ge, PhD; Xiaoyang Li; Tongmin Jiang; Tingting Huang, PhD

Literatures about designing ADT were begin at the end of the last century. Research on CSADT is comparative mature than research on SSADT...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, , Reliability Analysis/Prediction/Estimation

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

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