Library

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Design/Reliability,RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

A Study Of Scaling Effects On DRAM Reliability

by Mark White, PhD; Joseph B. Bernstein, PhD; Jin Qin, PhD;

Research of scaling effects on microelectronics reliability becomes more important for space and hi-reliability users as technology continues to advance at deep submicron levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality

by Zhengzheng Ge, PhD; Xiaoyang Li; Tongmin Jiang; Tingting Huang, PhD

Literatures about designing ADT were begin at the end of the last century. Research on CSADT is comparative mature than research on SSADT...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, , Reliability Analysis/Prediction/Estimation

Software Reliability Model with Bathtub-shaped Fault Detection Rate

by Swapna S. Gokhale, PhD; Lance Fiondella

Software does not wear out physically like hardware, which is directly subjected to mechanical and electrical stress through its lifetime. A thoroughly tested program should perform as required, assuming that its operating environment does not change...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Software Reliability

Planning a Reliability Growth Program Utilizing Historical Data

by Larry H. Crow, Ph.D

For many years prior to the Department of Def..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Birnbaum Importance in Solving Component Assignment Problems

by Xiaoyan Zhu, PhD; Way Kuo, PhD; Qingzhu Yao

As an important type of reliability optimization problems, the component assignment problem (CAP) is to find the optimal arrangement of n available components to n positions of a system such that the resulting system reliability is maximized...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Block Diagram, Reliability Model, Reliability Analysis/Prediction/Estimation, Design Reliability

Soft Error Trends and Mitigation Techniques in Memory Devices

by Charles Slayman;

As various system technologies scale to larger device complexity and higher%2..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

FaRBS: A New PoF Based VLSI Reliability Prediction Method

by Joseph B. Bernstein; Jin Qin; Hava Avshalom

It has long been a challenge for reliability engineers to provide accurate VLSI circuit reliability predictions. Decreasing feature sizes, coupled with non-ideal voltage scaling, raises new reliability concerns...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

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