Statistics Spotlight

2002

Column: Statistics Roundtable: Process modeling: find the critical few

by Snee , Ronald D.

Finding the critical few X's allows you to better control and optimize a process

With the widespread use of Six Sigma has come a renewed interest in developing statistical models and using regression analysis. Now is a good time to rethink your strategies for developing models. In particular, I believe it is...


Column: Statistics Roundtable: Find Confidence In Statistical Significance

by Gunst, Richard F.

Data analysts must be careful when interpreting statistical terms for untrained audiences

Confidence intervals and confindence level and statistical significances are different and must not be used as...


Chapter one, on the scientific method

by Hare, Lynne B.

Though the scientific method is fundamental to science and business, it is often misused, overlooked or abandoned

For example, on manufacturing lines there is an almost overwhelming temptation to adjust processes via the turn of a dial, process understanding and Q U A L I T Y P R O G R E S S I A U G U S T 2 0 0 2 I 77 Chapter One Though the scientific method is fund...


Variation in SPC.

by Mason, Robert L.; Young, John C.

How the two types of variation can each affect a control procedure

When radical process swings such as the ones described above are inherent Q U A L I T Y P R O G R E S S I A P R I L 2 0 0 2 I 79 Variation in SPC How the two types of variation can each affect a control procedure by Robert L. Mason and John C. Young STAT...


Shewhart charts and serially recorded data.

by Hunter, J. Stuart

The ability to produce time series data affects today's statistics applications

Today it is often possible to forgo sampling and, instead, measure every sequentially produced STATISTICS ROUNDTABLE I Shewhart Charts And Serially Recorded Data The ability to produce time series data affects today's statistics applications by J. Stuart...



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