A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology

Journal of Quality Technology vol. 41 issue 2 - April 2009

Abstract: [This abstract is based on the authors' abstract.] Nanotechnology has become a multidisciplinary subject that will affect every sector of the economy and daily life in the near future. Science-based technologies and the use of statistical methods have helped the advancement of nanotechnology. Some instances where statistical methods have been used in nanoscale applications are reviewed. Topics include experimental design, uncertainty modeling, process optimization and monitoring, and areas for future research.

Keywords: Automatic process control (APC); Design of experiments (DOE); Manufacturing process; Statistical design; Statistical quality control (SQC); Stochastic models