Two-Point Optimal Narrow Limit Plans with Applications to MIL-STD-105D

Journal of Quality Technology vol. 13 issue 2 - April 1981

Abstract: Narrow limit gauging combines the ease of attributes inspection with the power of variables sampling to reduce sample size. Tables of narrow limit plans that have two fixed points on the operating characteristic curve and are optimal in terms of minimum sample size are presented. Tables of narrow limit plans matched to the MIL-STD-105D tightened, normal, and reduced attributes plans are also given. These narrow limit plans, when substituted in the MIL-STD-105D system and used with the switching rules, provide a further reduction in sample size.

Keywords: Sampling; Probability; Sample size

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