Ellis Ott taught generations of quality practitioners to be explorers of the truth through the collection and graphical portrayal of data. From a simple plea to "plot the data" to devising a graphical analytical tool called the analysis of means (ANOM), Ott demonstrated that process knowledge is to be gained by seeking the information contained within the data.
In this newest version of Ott's classic text, the authors have strived to continue down the path that he created for others to follow. Additions to this revised edition include: the use of dot plots as an alternative to histograms; digidot plots; adding events to charts; emphasis on the role that acceptance control charts play in controlling risks and the computation of average run length (ARL); a new chapter devoted to process capability, process performance, and process improvement, including the use of confidence intervals for process capability metrics; narrow-limit gauging as another means of assessing the capability of a process; Six Sigma methodology; design resolution; scatter plot matrices as applied to datasets of higher dimensions; and a new chapter on measurement studies.
The CD-ROM includes many papers on ANOM and ANOME published in the Journal of Quality Technology, as well as a comprehensive Excel add-in for performing these analyses and freeware versions of some useful graphing and statistical utilities.
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- Additional Information
- ISBN: 978-0-87389-655-9
- Item Number: H1222
- Dimensions: 7 x 10
- For details on using this product as a textbook for your course or class, contact us
- About the Author(s)
Ellis R. Ott was revered as a pioneering leader in statistical quality control methods. The majority of Ott s career was spent in the Mathematics Department of Rutgers University, where he led ground-breaking work developing statistical professionals. Ott was honored often throughout his career, including ASQ s Brumbaugh Award, Grant Award, and Shewhart Medal, and was named an ASQ Honorary member. The Ellis R. Ott Award was named in his honor upon his death in 1981.
Edward G. Schilling is professor emeritus of statistics in the Center for Quality and Applied Statistics at Rochester Institute of Technology, where he has held the position of director of the Center and chair of the Graduate Statistics Department. Prior to joining R.I.T. he was manager of the Lighting Quality Operation for the Lighting Business Group of the General Electric Company. He received his B.A. and M.B.A. degrees from SUNY Buffalo, and his M.S. and Ph.D. degrees in statistics from Rutgers University.
Dean V. Neubauer is a senior engineering associate at Corning, Inc. He received his B.S. in statistics from Iowa State University and his M.S. in statistics from Rochester Institute of Technology, where he is currently an adjunct professor in statistics at the Center for Quality and Applied Statistics.