A New Attributes Sampling Plan for Integrated Units and Its Practical Application


Miyazaki, Haruo; Osada, Toshio   (1990, ASQC)   Gunma University, Gunma, Japan; The Yokohama Rubber Co., Ltd., Tokyo, Japan

Annual Quality Congress, San Francisco, CA    Vol. 44    No. 0
QICID: 9592    May 1990    pp. 1057-1062
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Article Abstract

An economic inverse sampling plan by attributes for integrated units or system units is developed for situations where sampling inspection is non-destructive. It is assumed that an integrated unit is composed of m(_> 2) parts and is classified as "defective" if at least one of rn parts is defective. In this paper, the inverse sampling plan is proposed based on a negative binomial-binomial distribution for the defectives of integrated units caused by the defects of composed parts being to be binomial distribution. A linear cost model is developed and method for designing sampling plan is presented. A practical. application of this plan to the sarapling of the ceramic condensor unit which is composed some parts is performed and we obtain a effective and useful result.



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