Confidence Interval Procedures for the Weibull Process With Applications to Reliability Growth


Crow, Larry H.   (1982, ASQC and the American Statistical Association)   U.S. Army Materiel Systems Analysis Activity, Aberdeen, MD

Technometrics    Vol. 24    No. 1
QICID: 9044    February 1982    pp. 67-72
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Article Abstract

The Weibull Process is considered as a stochastic model for the Duane (1964) reliability growth postulate. Under this model the mean time between failure (MTBF) for the system at time t is given by M(t)=[r(t)]-1. Small sample and asymptotic confidence intervals on M(t) are discussed for failure- and time-truncated testing. Tabled values to compute the confidence intervals and numerical examples illustrating these procedures are presented.


Confidence intervals,Mean time between failures (MTBF),Failure analysis

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