Hahn, Gerald J. (1975, ASQC and the American Statistical Association) General Electric Company, Schenectady, NY
This article provides a lower simultaneous prediction limit on the means of all of k future samples using the results of a previous sample from the same exponential distribution.Such limits are required as specifications on future life for components, as warranty limits for the future performance of a specified number of systems with standby units, and in various other applications.Exact and approximate limits are given and illustrated with a numerical example. The results are extended to situations where the past and/or future samples are censored. Some other prediction limits for the exponential distribution are also summarized. The mathematical justification of the results is briefly developed in an appendix.The discussion is in the general context of life testing analysis.
Prediction intervals,Prediction,Life testing,Statistical methods