Chernoff, Herman (1962, ASQC and the American Statistical Association) Stanford University
A technique is developed to obtain optimal accelerated life designs for estimating the parameters describing the mean lifetime of a device under a standard environment. Five examples involving variations of models and experimental design are studied. An exponential distribution of lifetimes is assumed in each of the five problems. The general approach, applying a method of Elfving, is applicable to a large variety of models.