Control Schemes for Low Count Levels

Article

Lucas, James M.   (1989, ASQC)   E.I. du Pont de Nemours & Company

Journal of Quality Technology    Vol. 21    No. 3
QICID: 5642    July 1989    pp. 199-201
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Article Abstract

The count of counts (this usually means defects) which occur at very low levels is discussed. Very low count levels can be below the range of counts covered in a previous article on Counted Data CUSUMS. In this era of improved quality and increasing quality awareness, very low count regimes are important. This paper describes two practical procedures for the control of low count levels and tells when they should be used. Because both schemes can be represented as CUSUM schemes, it is easy to develop their properties. In particular, the Average Run Length (ARL) for these procedures is given, where the ARL is the average number of samples taken before an out-of-control signal occurs.

Keywords

Process control,Head start,Fast initial response (FIR),Defects,Average run length (ARL),Cumulative sum control chart (CUSUM)


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