Maximum Allowable Percent Defective (MAPD) Single Sampling Inspection by Attributes Plan

Article

Soundararajan, V.   (1975, ASQC)   State Planning Commission, Madras, India

Journal of Quality Technology    Vol. 7    No. 4
QICID: 5209    October 1975    pp. 173-182
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Article Abstract

In this paper, Single Sampling Attributes Plans indexed by Maximum Allowable Percent Defectives (MAPD) are given. A table, for transition from one set of parameters to match the Operating Characteristic Curve (OC curve) to other similar sets, is given.

Keywords

Statistical methods,Attributes sampling plans


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