Graphical Determination of Single-Sample Attribute Plans for Individual Small Lots

Article

Ladany, Shaul P.   (1971, ASQC)   Tel-Aviv University, Tel-Aviv, Israel

Journal of Quality Technology    Vol. 3    No. 3
QICID: 5083    July 1971    pp. 115-119
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Article Abstract

When the number of defectives in a lot is small compared to the sizes of the lot and the sample, a sampling plan for that lot can be based on the Binomial II approximation to the hypergeometric distribution. A trial-and-error procedure is given for generating sampling plans by the graphical solution of this approximation.

Keywords

Short runs,Binomial distribution,Graphical methods


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