Woods, W. Max; Zehna, Peter W. (1966, ASQC) C-E-I-R, Inc.; U. S. Naval Postgraduate School
- Industrial Quality Control Vol. 22 No. 8
- QICID: 4939 February 1966 pp. 411-412
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A formula is derived to show how different accuracies at various levels of calibration affect the final accuracy of a measuring device; examples are discussed.
Measurement and control
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