Sequential Life Testing Plans for the Exponential Distribution

Article

Lieberman, Alfred   (1959, ASQC)   Institute for Defense Analyses

Industrial Quality Control    Vol. 16    No. 2
QICID: 4403    August 1959    pp. 14-18
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Article Abstract

The lifetime of a wide range of equipment can be predicted on the basis of the exponential distribution. Save time in testing either one item at a time or many items at the same time. In general, good items will be accepted rapidly, poor items rejected rapidly, while questionable items will require additional testing.

Keywords

Reliability


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