An Application of Variance Component Analysis in the Transistor Industry

Article

Anderson, Roger W.; Wortham, Dr. A. W.   (1958, ASQC)   Texas Instruments, Inc.

Industrial Quality Control    Vol. 14    No. 9
QICID: 4306    March 1958    pp. 11-14
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Article Abstract

Analysis of Variance, customarily used on experimental data to determine the major sources of variation and their interactions, is applied to a slightly different problem. Here it is used to analyse the magnitude of the effect on performance not only of individual transistors but also their combined effects in a receiver.

Keywords

Experiments


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