Economies in Testing of Electronic Systems


Raheja, Dev   (1986, ASQC)   Technology Management, Inc., Laurel, MD

40th Annual Quality Congress, May 1986, Anaheim, CA    Vol. 40    No. 0
QICID: 3195    May 1986    pp. 297-300
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Article Abstract

This paper covers techniques for determining how much environmental screening tests need to be performed. The need is based on testing philosophies and the life cycle cost optimization. Not to be overlooked is reliability which should be a component of the life cycle model. The author recommends use of dynamic burn-in and automated test equipment to accomplish productivity and economies in testing of electronic systems.


Electronics industry

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