Inspect Small Samples When Quality is Poor


Nelson, Wayne; Wall, George E.; Caporal, Patricia   (1986, ASQC)   General Electric Company, Schenectady, NY

40th Annual Quality Congress, May 1986, Anaheim, CA    Vol. 40    No. 0
QICID: 3171    May 1986    pp. 140-148
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Article Abstract

The General Electric Ordnance Systems Department has saved $300,000 annually in incoming inspection for attributes through the new switching scheme presented here. In contrast to the switching shcme of MIL-STD-105D which does not reduce the sample size for very bad quality history, the scheme here reduces sample size, because a large sample is not needed to reject a very defective lot.



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