Two Improved Runs Rules for the Shewhart X Control Chart

Article

Khoo, Michael B.C.; Ariffin, Khotrun   (2006, ASQ and Taylor & Francis Group, LLC)   Universiti Sains Malaysia, Minden, Penang, Malaysia

Quality Engineering    Vol. 18    No. 2
QICID: 20471    April 2006    pp. 173-178
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Article Abstract

[This abstract is based on the authors' abstract.]A Shewhart X control chart incorporating runs rules is better for detecting small process shifts, thus enabling faster detection of assignable causes. Two improved runs rules are proposed, and average run lengths are computed and compared to existing rules. The comparison shows the new rules to be superior for the detection of large process average shifts and similar to others for the detection of small shifts.

Keywords

Average outgoing quality limit (AOQL),Control limits,Run rules,Runs tests,Shewhart control chart


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