Equal Probability Chart and Applications in Chemical Batch Process


Chen, W.-W.; Liao, J. J.   (1999, Marcel Dekker, Inc. and ASQ)   Everlight Chemical Industrial Corporation, Tao-Yuan, Taiwan, Republic of China; Genetics Institute, Andover, MA

Quality Engineering    Vol. 12    No. 2
QICID: 13896    December 1999    pp. 217-224
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Article Abstract

[This abstract is based on the authors' abstract.] The Shewhart chart is the most popular control chart used at manufacturing sites due to it simplicity and certain capability to detect process change. If there are equal probability intervals, the traditional histogram will look flat. Combining this intuitive idea with the Shewhart chart, a new control chart is constructed: the Equal Probability (EP) chart. The EP chart is as simple to operate as the Shewhart chart, but more powerful. The EP chart not only provides a conventional level of protection against system upsets, but it is also more sensitive to variability decreases. Therefore, the EP chart provides more opportunity for process improvements. The EP chart is applied to two data sets from the chemical batch process, and it performs better than the Shewhart chart.


Average run length (ARL),Shewhart control chart,Probability,Control charts

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