A Synthetic Control Chart for Detecting Small Shifts in the Process Mean


Wu, Zhang; Spedding, Trevor A.   (2000, ASQ)   Nanyang Technology University, Singapore

Journal of Quality Technology    Vol. 32    No. 1
QICID: 13858    January 2000    pp. 32-38
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Article Abstract

[This abstract is based on the authors' abstract.] A synthetic control chart is presented as an integration of the Shewhart X-bar chart and the conforming run length chart. Like the Shewhart X-bar chart, the synthetic chart is used to detect the process mean shift, d. It was found from intensive performance tests that the synthetic control chart consistently produced smaller out-of-control average run lengths (ARLs) than the Shewhart X-bar chart (with or without supplementary run rules) for any size of d when the false alarm rate is held at a specified value. Compared to the X-bar chart, when d is between 0.5s and 1.5s , the synthetic chart can reduce out-of-control ARL by nearly half. The synthetic control chart also outperforms the exponentially weighted moving average (EWMA) and the joint X-bar-EWMA charts when d is greater than 0.8s.


Average run length (ARL),X-bar control charts,Exponentially weighted moving average control charts (EWMA),Control charts

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