Reliability Test Plans for One-Shot Devices Based on Repeated Samples

Article

Bain, Lee; Engelhardt, Max   (1991, ASQC)   University of Missouri-Rolla

Journal of Quality Technology    Vol. 23    No. 4
QICID: 11307    October 1991    pp. 304-311
List $10.00
Member $5.00

FOR A LIMITED TIME, ACCESS TO THIS CONTENT IS FREE!
You will need to be signed in.
New to ASQ? Register here.

Article Abstract

A "one-shot" device has the property that a successful test results in its destruction. An obvious example is the testing of an explosive device selected from a stockpile of military weapons. The type of data obtained differs from that of the standard life-testing situation. Such data is dichotomous (go or no go) rather than data obtained by measuring a continuous variable such as failure time or stress level. The emphasis in this paper is on test plans for periodic testing of highly reliable one-shot devices. Based on model assumptions, the sequence of minimal sample sizes, achieving specified reliability criteria, are derived.

Keywords

Confidence limits,Reliability,Weibull analysis,Statistical tests,Sample size


Browse QIC Articles Chronologically:     Previous Article     Next Article

New Search

Featured advertisers





ASQ is a global community of people passionate about quality, who use the tools, their ideas and expertise to make our world work better. ASQ: The Global Voice of Quality.