Volume 31 • Issue 3
- Specification Limits, Capability Indices, and Process Centering in Assembly Manufacture (PDF, 516 KB)
Mahmut Parlar and George O. Wesolowsky - The Effects of Autocorrelation and Outliers on Two-Sided Tolerance Limits (PDF, 1.12 MB)
Raid W. Amin and S.J. Lee - Robustness of the EWMA Control Chart to Non-normality (PDF, 446 KB)
Connie M. Borror, Douglas C. Montgomery, and George C. Runger - The Optimum Mean for Processes with Normally Distributed Measurement Error (PDF, 710 KB)
Sung Hoon Hong and E.A. Elsayed - Transforming the Exponential for SPC Applications (PDF, 477 KB)
Rudolf G. Kittlitz, Jr. - Control Charts for Monitoring the Mean and Variance of Autocorrelated Processes (PDF, 1.22 MB)
Chao-Wen Lu and Marion R. Reynolds, Jr. - A General Piecewise Linear Canning Problem Model (PDF, 971 KB)
Phillip E. Pfeifer - Joint Monitoring of PID-Controlled Processes (PDF, 828 KB)
Fugee Tsung, Jianjun Shi, and C.F.J. Wu
DEPARTMENTS
- Book Reviews (PDF, 819 KB)
- Computer Programs (PDF, 379 KB)
- Technical Aids (PDF, 123 KB)
