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Product Robust Design via Accelerated Degradation Tests

Summary: Annual RELIABILITY and MAINTAINABILITY Symposium 2009 PROCEEDINGS To cite the Proceedings as a reference: 2009 Proc. Ann. Reliability & Maintainability Symp. The Symposium does not copyright this Proceedings itself but uses one of its cosponsors (IEEE) to perform this service and associated administration. Copyright & Reprint Permission Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of US copyright law for the private use of patrons those articles in this Proceedings that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through: Copyright Clearance Center · 222 Rosewood Drive · Danvers, Massachusetts 01923 USA For other copying, reprint or reproduction permission, write to: IEEE Copyrights Manager IEEE Operations Center PO Box 1331 (445 Hoes Lane) Piscataway, New Jersey 08855-1331 USA Copyright © 2009 by the Institute of Electrical & Electronics Engineers, Inc. All rights reserved. Printed in the United States of America ISSN 0149-144X CD ROM ISBN: 978-1-4244-2509-9 Library of Congress 78-132873 IEEE Catalog Number: CFP09RAM-CDR Main

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