Library

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model

The Web-Accessible Repository of Physics-based Models (WARP)

by David Nicholls, CRE; Aaron Riesbeck;

The current trend in systems engineeri..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model

Reliability Predictions to Support a Design For Reliability Program

by Lori E. Bechtold;

Industry and the DoD are working together to revamp reliability prediction processes so that they provide the needed information to the design process in a timely fashion as well as provide relevant information for decisions in testing and sustainable......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Dynamic Fault Tree Analysis Based On The Structure Function

by Jean-Marc Roussel, PhD; Jean-Jacques Lesage, PhD; Guillaume Merle, PhD;

Fault Tree..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Fault Tree Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Reliability Growth and the Caveats of Averaging: a Centaur Case Study

by Joseph R. Fragola, D. Sc., PE; Elisabeth L. Morse; Blake F. Putney;

Reliability Growth..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

An Optimization Approach for Safety Instrumented System Design

by Lothar Litz; Konstantin Machleidt;

In chemical and process industry SISs are applied to keep under control dangerous processes..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Systems Engineering, Design Reliability

Analyzing Interconnection Design Safety Using Bent Pin Analysis

by Nathaniel W. Ozarin,;

Low-tech hazards can cause catastrophic results in safety- critical and other systems...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Review, Design Reliability, Fault Tree Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Systems Engineering

Human Rating of Launch Vehicles: Historical and Potential Future Risk

by Joseph R. Fragola, P.E., D.Sc.; Benjamin J. Franzini;

Approaches..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Product Reliability, RAMS 2011 Proceedings, Systems Engineering

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Design/Reliability,RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Design/Reliability, RAMS 2011 Proceedings, Reliability Model

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