Library

Efficient Analysis of Imperfect Coverage Systems with Functional Dependence

by Liudong, Xing; Dugan, Joanne Bechta; Morrissette, Brock A.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-11
  • Keywords:RAMS 2010 Proceedings, Product Development, Process Reliability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation, Software Reliability, Systems Engineering

Nonparametric Life Consumption Modeling of High End Drilling Tools

by Martin John; Jörg Baumann; Dustin R. Garvey;

This paper describes a new individual based, nonparametric life consumption model (LCM) that builds on the previously described path classification and estimation model (PACE)...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Engineering, Statistics

Reliability Analysis of Missions with Cooperating Platforms

by Remenyte-Prescott, Rasa; Prescott, Darren R.; Andrews, John D.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists......

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Fault Tree Analysis, Product Development, Product Reliability, Reliability Analysis/Prediction/Estimation, Reliability Model, Systems Engineering

Calculating an Appropriate Multiplier For βλ When Modeling Common Cause Failure in Triplex Systems

by Chalupa, Rudolf; Bukowski, Julia V. ;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Failure Rate, Product Reliability, Software Reliability

Risk Informed Design Modeling Process

by Chris Mattenberger;

As part of NASA’s Constellation Program the Altair
lun..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Conceptual Design, Reliability Model, Reliability

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