Library

Efficient Analysis of Imperfect Coverage Systems with Functional Dependence

by Liudong, Xing; Dugan, Joanne Bechta; Morrissette, Brock A.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-11
  • Keywords:RAMS 2010 Proceedings, Product Development, Process Reliability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation, Software Reliability, Systems Engineering

Developmental Space-System Elicitation Techniques for Risk-Informed Design Practices

by Blake F. Putney; Benjamin J. Franzini;

This paper conveys a method of risk-informed design that is guided by system design documents and based on designer interaction. Designers focused on reliability strategies that were influenced and implemented by the designer’s own expertise...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Risk Assessment, Failure Analysis, Monte Carlo Analysis

Modeling and quantification of aging systems for maintenance

by Ziani, Rachid; Roussignol, Michel; Mercier, Sophie ; Lair, William;

This article deals with the maintenance optimization of an air conditioning system. The Piecewise Deterministic Markov Processes method! is used to model this system. The finite volumes algorithm is used to calculate the reliability quantities...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Optimizing Equipment Maintenance, Availability, Markov

The Application of CREAM Based on HAZOP Analysis in Using Process of System

by Wei. Wang,; Tingdi. Zhao,;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Fault Tree Analysis, Product Reliability, Product Development, Reliability Model, Software Reliability, Systems Engineering

Reliability Analysis of Missions with Cooperating Platforms

by Remenyte-Prescott, Rasa; Prescott, Darren R.; Andrews, John D.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists......

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Fault Tree Analysis, Product Development, Product Reliability, Reliability Analysis/Prediction/Estimation, Reliability Model, Systems Engineering

Degraded Systems with Multiple Performance Parameters

by Yi, Xiao-shan ; Tao, Jun-yong ; Li, Chun-yang; Chen, Xun ;

The reliability of degraded systems with multiple performance para!..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Product Reliability

Calculating an Appropriate Multiplier For βλ When Modeling Common Cause Failure in Triplex Systems

by Chalupa, Rudolf; Bukowski, Julia V. ;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Failure Rate, Product Reliability, Software Reliability

A Multi-Objective Memetic Algorithm for RBDO and Robust Design

by Zhuang, Xiaotian ; Pan, Rong ;

An efficient Multi-Objective Memetic Algorithm is presented here to optimize reliability and robustness where produ!..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Product Reliability, Reliability Model

Lead-Free Solder Joint Thermal Cycling Reliability Research Status

by Qi, Haiyu

by Haiyu Qi, Ph.D., Dell Reliability Engineering..

  • Filetype: doc
  • Publish date: 2007-02
  • Keywords:Engineering

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