Library

Sensor Recovery for Robust Multivariate Condition Monitoring

by Jian Sun, Graduate Student; Haitao Liao, PhD;

This paper addresses a sensor recovery methodology and provides a computational tool for improving the robustness of multichannel condition monitoring..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Software Reliability, Failure Analysis

Improving Software-Based System R&M with Better Error Processing

by Nathaniel W. Ozarin

Improved use of error detection and reporting can greatly approve system reliability, safety, and maintainability...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Software Reliability, Process Management, Data Analysis

Model-driven Automated Software FMEA

by Snooke, Neal; Price, Chris

This paper will describe how software FMEA can be automated both for low-level languages intended for safety critical embedded systems, and also for model-driven software developments...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Design Review, Software Reliability

Advanced Models for Software Reliability Prediction

by Zigmund Bluvband, PhD; Sergey Porotsky, PhD; Michael Talmor, M.Sc;

One of the main questions in the Reliability Software Analysis an..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Quality Assurance, Product Reliability, RAMS 2011 Proceedings, Software Reliability

Software Reliability Model with Bathtub-shaped Fault Detection Rate

by Swapna S. Gokhale, PhD; Lance Fiondella

Software does not wear out physically like hardware, which is directly subjected to mechanical and electrical stress through its lifetime. A thoroughly tested program should perform as required, assuming that its operating environment does not change...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Software Reliability

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

Improvements In Estimating Software Reliability From Growth Test Data

by D’Onofrio, Paul; Dwyer, Dave

Line plotting for Musa’s Basic law can be improved by applying some lessons from E. O. Codier’s paper on hardware reliability growth plotting...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Software Reliability

Efficient Analysis of Imperfect Coverage Systems with Functional Dependence

by Liudong, Xing; Dugan, Joanne Bechta; Morrissette, Brock A.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-11
  • Keywords:RAMS 2010 Proceedings, Product Development, Process Reliability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation, Software Reliability, Systems Engineering

Increasing The Reliability Of A Self-Optimizing Railway Guid. Sys.

by Sondermann-Wölke, Christoph; Sextro, Walter; Geisler, Jens;

Self-Optimizing methods were applied to a railway system to improve dependability and reliability. System performance was de! monstrated using a test track...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Reliability Model, Electronics, Software Reliability

SEU Concept to Reality (Allocation, Prediction, Mitigation)

by Bidokhti, Nematollah ;

SEUs are caused by either atmospheric neutrons or alpha particles emitted by trace impurities in the silicon processing and packaging materials. SEUs could cause single or multiple bit errors in the components such as ASCIs,FPGAs, processors and memories...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Event Tree, Software Reliability, Electronics

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