Library

Practical Reliability Testing of Structures Under Road Loadings

by Julio Pulido, PhD;

Examples of mechanical structures under road and self-induced vibration are presented. Vibration testing planning using finite element techniques associated with several f..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Strength-Load, Product Design/Reliability

Optimization of the Test Stress Levels of an ADT

by Zheng-Zheng Ge; Xiao-Yang Li; Tong-Min Jiang; Jing-Rui Zhang;

This paper optimizes a design of an ADT by optimizing its stress levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Degradation, Monte Carlo Analysis, Process Design/Reliability

System Reliability Models with Stress Covariates for Changing Load Profiles

by Mark Agnello; Keith Megow; David Coit; Akira Hada;

New system reliability models are presented and demonstrated to anticipate system reliability and availability%..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,System Reliability, Strength-Load, Weibull, Accelerated Life Testing

Optimized Acoustic Microscopy Screening for Multilayer Ceramic Capacitors

by Schwartz, Stanley W.; Kostic, Andrew D.

An optimized acoustic microscopy screening process has been developed for multi layer ceramic chip capacitors that identifies potential early life failures for removal. Accelerated life testing has validated the effectiveness of the methodology...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Failure Analysis, Product Reliability

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

A Study Of Scaling Effects On DRAM Reliability

by Mark White, PhD; Joseph B. Bernstein, PhD; Jin Qin, PhD;

Research of scaling effects on microelectronics reliability becomes more important for space and hi-reliability users as technology continues to advance at deep submicron levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality

by Zhengzheng Ge, PhD; Xiaoyang Li; Tongmin Jiang; Tingting Huang, PhD

Literatures about designing ADT were begin at the end of the last century. Research on CSADT is comparative mature than research on SSADT...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, , Reliability Analysis/Prediction/Estimation

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

Achieving Reliability Goals for an EFV LRU through Laboratory Testing

by Pan, John; Loychik, Neil E.

Lessons learned with respect to the EFV’s HEU ALT program. Comparison of single axis ! and multi-axis controlled random vibration test techniques versus single axis and pneumatic repetitive shock...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Product Reliability

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