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Hybrid Causal Models for System Diagnostics

by Chengdong Wang;

This paper presents a hybrid causal modeling approach for system diagnostic. An algorithm that can be generalized for any system diagnostics process based on Vesely-Fussell importance measure is discussed...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Bayesian, System Reliability, Reliability Model, Networks

Reliability Growth Planning for Discrete-Use Systems

by J. Brian Hall, Ph.D.;

This paper presents new RG planning methodology for discrete-use systems being utilized within the DoD...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability Growth, Reliability Model, Product Design/Reliability

Reliability Growth Test Design – Connecting Math to Physics

by Milena Krasich P. E

The paper describes a methodology for modeling reliability improvement test strategies to apply physics of failure and cumulative damage models with the related mathematics, and correlate tests to the product use in life...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability Growth, Failure Analysis, Reliability Model, Strength-Load

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model

The Web-Accessible Repository of Physics-based Models (WARP)

by David Nicholls, CRE; Aaron Riesbeck;

The current trend in systems engineeri..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model

Availability Growth Modeling and Assessment

by Zigmund Bluvband, PhD; Sergey Porotsky, PhD

Availability Growth process, applied to a system undergoing development and field test, is introduced, and its parameters estimation methodology is developed and presented ...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability Growth, Availability Model, Markov

Analyzing Interconnection Design Safety Using Bent Pin Analysis

by Nathaniel W. Ozarin,;

Low-tech hazards can cause catastrophic results in safety- critical and other systems...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Review, Design Reliability, Fault Tree Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Systems Engineering

Condition Diagnosis with Complex Network-Time Series Analysis

by Peilin Yang, PhD; Jianmin Gao, PhD; Jiacheng Pan, MS; Hongquan Jiang, PhD

Safety and reliability have always been the one of utmost and most important tasks, especially in chemical industry. The process industry system is a collection of many kinds of equipment, and it is usually of complex and integrated structures...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Process Design/Reliability

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Design/Reliability, RAMS 2011 Proceedings, Reliability Model

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

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