Library

Analyzing Interconnection Design Safety Using Bent Pin Analysis

by Nathaniel W. Ozarin,;

Low-tech hazards can cause catastrophic results in safety- critical and other systems...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Review, Design Reliability, Fault Tree Analysis, Product Reliability, Quality Assurance, RAMS 2011 Proceedings, Reliability Model, Systems Engineering

The Web-Accessible Repository of Physics-based Models (WARP)

by David Nicholls, CRE; Aaron Riesbeck;

The current trend in systems engineeri..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis/ Physics of Failure, Failure Rate, Product Reliability, Quality Assurance, RAMS 2011 Proceedings, Reliability Model

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Software Reliability Model with Bathtub-shaped Fault Detection Rate

by Swapna S. Gokhale, PhD; Lance Fiondella

Software does not wear out physically like hardware, which is directly subjected to mechanical and electrical stress through its lifetime. A thoroughly tested program should perform as required, assuming that its operating environment does not change...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Software Reliability

Planning a Reliability Growth Program Utilizing Historical Data

by Larry H. Crow, Ph.D

For many years prior to the Department of Def..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Birnbaum Importance in Solving Component Assignment Problems

by Xiaoyan Zhu, PhD; Way Kuo, PhD; Qingzhu Yao

As an important type of reliability optimization problems, the component assignment problem (CAP) is to find the optimal arrangement of n available components to n positions of a system such that the resulting system reliability is maximized...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Block Diagram, Reliability Model, Reliability Analysis/Prediction/Estimation, Design Reliability

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Reliability, RAMS 2011 Proceedings, Reliability Model

Modeling Science Objectives within a Probabilistic Risk Assessment

by Smith, Clayton; Kubota, Sanae; Jones, Melissa; Fretz, Kristin

This paper discusses modeling aspects of the Radiation Belt Storm Probes (RBSP) science objectives..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis/ Physics of Failure, Product Reliability, RAMS 2011 Proceedings, Reliability Model

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