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Reliability Predictions to Support a Design For Reliability Program

by Lori E. Bechtold;

Industry and the DoD are working together to revamp reliability prediction processes so that they provide the needed information to the design process in a timely fashion as well as provide relevant information for decisions in testing and sustainable......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Integrated Developmental and Operational Testing To Evaluate Reliability

by Sullivan,Richards; Krolweski, Jane; Harpel,Beth

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability and Availability Assessment, Failure Analysis, Reliability Analysis/Prediction/Estimation

Dynamic Fault Tree Analysis Based On The Structure Function

by Jean-Marc Roussel, PhD; Jean-Jacques Lesage, PhD; Guillaume Merle, PhD;

Fault Tree..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Fault Tree Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Reliability Growth and the Caveats of Averaging: a Centaur Case Study

by Joseph R. Fragola, D. Sc., PE; Elisabeth L. Morse; Blake F. Putney;

Reliability Growth..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Design/Reliability,RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Condition Diagnosis with Complex Network-Time Series Analysis

by Peilin Yang, PhD; Jianmin Gao, PhD; Jiacheng Pan, MS; Hongquan Jiang, PhD

Safety and reliability have always been the one of utmost and most important tasks, especially in chemical industry. The process industry system is a collection of many kinds of equipment, and it is usually of complex and integrated structures...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Process Design/Reliability

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

A Study Of Scaling Effects On DRAM Reliability

by Mark White, PhD; Joseph B. Bernstein, PhD; Jin Qin, PhD;

Research of scaling effects on microelectronics reliability becomes more important for space and hi-reliability users as technology continues to advance at deep submicron levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality

by Zhengzheng Ge, PhD; Xiaoyang Li; Tongmin Jiang; Tingting Huang, PhD

Literatures about designing ADT were begin at the end of the last century. Research on CSADT is comparative mature than research on SSADT...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, , Reliability Analysis/Prediction/Estimation

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