Library

Importance Analysis With Markov Chains

by Fricks, Ricardo M.; Trivedi, Kishor S.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 6A: Repairable Systems Modeling. Moderator: Justin Chimka - University of Arkansas...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Reliability and Availability Assessment, Reliability Block Diagram, Repairable Systems,

Predict: A Case Study, Using Fuzzy Logic

by III, William J. Kerscher; Booker, Jane M.; Meyer, Mary A.; Smith, Ronald E.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 8C: Reliability Prediction. Moderator: Dick Doyle - Doyle & Associates...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Reliability Prediction, Bayesian Analysis, Reliability Growth, Quality Assurance

A Software Reliability Methodology Using Software Sneak Analysis, SW FMEA and the Integrated System Analysis Approach

by Craig, John H.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 5C: Software Reliability. Moderator: Christian K. Hansen - Eastern Washington University...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:Software Reliability, Failure Mode and Effects Analysis, Fault Tree Analysis, Integrated Systems Analysis, RAMS 2003 Proceedings

Accelerated Testing for Demonstration of Product Lifetime Reliability

by Krasich, Milena

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 6B: Accelerated Life Testing. Moderator: Pantellis Vassiliou - ReliaSoft Corporation...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:Accelerated Life Testing,Product Reliability, Strength-Load, Sample Size, RAMS 2003 Proceedings

An Approach for the Advanced Planning of a Reliability Demonstration Test Based on a Bayes Procedure

by Krolo, Anna; Bertsche, Bernd

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11A: Statistics/Bayesian Methods. ...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Bayesian Analysis, Sample Size, Weibull

Developing MESA: An Accelerated Reliability Test

by Baskoro, Gembong; Rouvroye, Jan L.; Bacher, Willibald; Brombacher, Aarnout C.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11A: Statistics/Bayesian Methods. ...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Accelerated Life Test, Reliability Growth

Collaboration in R&M Applications

by Johnston, Donald C.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 9D: Application of R&M Tools. Moderator: Darvin Heer - Raytheon...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Application of R & M Tools, Reliability Model, Maintainability

A Practical Approach to System Reliability Growth Modeling and Improvement

by Yadav, Om P.; Singh, Nanua; Goel, Parveen S.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11D: IIE - R&M Modeling and. Moderator: Robert J. Loomis - NASA...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,R&M Modeling and Optimization,Bayesian Analysis, Weibull

A Study on Component Obsolescence Mitigation Strategies and Their Impact on R&M

by Tomczykowski, Walter J.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11C: Aging. Moderator: Audrey Finot - Hewlett Packard...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Life Cycle Cost, Maintainability

A Framework for Documenting and Analyzing Life-Cycle Costs Using a Simple Network Based Representation

by Davis, Neil; Jones, Jeff; Warrington, Les

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 9B: Life Cycle Cost and Reliability. Moderator: Kenneth E. Murphy - ARINC Engineering Services...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Life Cycle Cost

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