Library

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Reliability, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Reliability, RAMS 2011 Proceedings, Reliability Model

Condition Diagnosis with Complex Network-Time Series Analysis

by Peilin Yang, PhD; Jianmin Gao, PhD; Jiacheng Pan, MS; Hongquan Jiang, PhD

Safety and reliability have always been the one of utmost and most important tasks, especially in chemical industry. The process industry system is a collection of many kinds of equipment, and it is usually of complex and integrated structures...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Process Reliability

Efficient Analysis of Imperfect Coverage Systems with Functional Dependence

by Liudong, Xing; Dugan, Joanne Bechta; Morrissette, Brock A.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-11
  • Keywords:RAMS 2010 Proceedings, Product Development Planning, Process Reliability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation, Software Reliability, Systems Engineering

Reliability Test Procedures for Achieving Highly Robust Electronic

by Tekcan, Tarkan ; Kirişken, Barbaros ;

© 2010 IEEE.Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyright

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Failure Analysis/ Physics of Failure, Product Reliability, Process Reliability, Reliability

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RAMS 2012