A Practical Approach To Accelerated Stress Testing for Avionics Products

by Michael A. Zimmermann;

This paper outlines a test philosophy developed to
overcome a small sample size while applying adequate stress
levels in a manner..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,HALT/HASS, Accelerated Life Testing, Root Cause Analysis

Step-Stress ADT Data Estimation based on Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

Product performance degradation data of Step-Stress Accelerated Degradation Testing (SSADT) is time series. Hence, a time series method is proposed to analyses SSADT data...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Statistics, Demonstration Tests, Degradation, HALT/HASS

Optimizing the Number of Failure modes for Design Analysis Based on Physics of Failure

by Loll, Valter

Design for reliability requires a different approach from Failure Reporting and Corrective Action System (FRACAS) and Test, Analyze and Fix (TAAF) both of which are tools for reliability improvement of already designed hardware..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Failure Analysis, Design Reliability, HALT/HASS, Accelerated Life Testing

Electronics in Harsh Environments - Product Verification and Validation

by Stentoft, Kirsten; Petersen, Marie Louise

In this paper harsh environments are defined as a mix of contamination, aggressive gasses and high humidity. The effect of these impacts will increase by higher temperatures..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Electronics, HALT/HASS, Product Development Planning

Optimum Plans for Step-Stress Accelerated Life Tests at Higher Usage Rates

by Yang, Guangbin

The increase in usage rate may prolong or shorten usage to failure. In this paper, a model that relates life to stress and usage rate is described...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Accelerated Life Testing, Weibull Analysis, HALT/HASS

How to Develop a Qualification Test Plan for RoHS Products

by Silverman, Mike Andrew; Schenkelberg, Fred; Hillman, Craig

The subject matter we consider in this paper are the significant reliability uncertainties around Lead-Free Solder and how to best consider these risks and mitigate them so as not to take a hit in the area of reliability during the lead-free transition...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,HALT/HASS, Accelerated Life Testing, Reliability Testing

HALT vs. ALT: When to Use Which Technique?

by Silverman, Mike

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 09A: Accelerated Life Testing and Aging. Moderator: Adamantios Mettas, ReliaSoft...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,HALT/HASS, Accelerated Life Testing

Cost Effective Accelerated Testing

by Misra, R. B.; Vyas, B. M.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 6B: Accelerated Life Testing. Moderator: Pantellis Vassiliou - ReliaSoft Corporation...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:Accelerated Life Test, HALT/HASS, RAMS 2003 Proceedings

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