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Sensor Recovery for Robust Multivariate Condition Monitoring

by Jian Sun, Graduate Student; Haitao Liao, PhD;

This paper addresses a sensor recovery methodology and provides a computational tool for improving the robustness of multichannel condition monitoring..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Software Reliability, Failure Analysis

Reliability Growth Test Design – Connecting Math to Physics

by Milena Krasich P. E

The paper describes a methodology for modeling reliability improvement test strategies to apply physics of failure and cumulative damage models with the related mathematics, and correlate tests to the product use in life...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability Growth, Failure Analysis, Reliability Model, Strength-Load

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model

The Web-Accessible Repository of Physics-based Models (WARP)

by David Nicholls, CRE; Aaron Riesbeck;

The current trend in systems engineeri..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model

Reliability Predictions to Support a Design For Reliability Program

by Lori E. Bechtold;

Industry and the DoD are working together to revamp reliability prediction processes so that they provide the needed information to the design process in a timely fashion as well as provide relevant information for decisions in testing and sustainable......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Integrated Developmental and Operational Testing To Evaluate Reliability

by Sullivan,Richards; Krolweski, Jane; Harpel,Beth

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability and Availability Assessment, Failure Analysis, Reliability Analysis/Prediction/Estimation

Optimized Acoustic Microscopy Screening for Multilayer Ceramic Capacitors

by Schwartz, Stanley W.; Kostic, Andrew D.

An optimized acoustic microscopy screening process has been developed for multi layer ceramic chip capacitors that identifies potential early life failures for removal. Accelerated life testing has validated the effectiveness of the methodology...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Failure Analysis, Product Reliability

Reliability Growth and the Caveats of Averaging: a Centaur Case Study

by Joseph R. Fragola, D. Sc., PE; Elisabeth L. Morse; Blake F. Putney;

Reliability Growth..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Design/Reliability,RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

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