Library

Reliability Assessment of High-Concentration Photovoltaic Trackers

by Jon G. Elerath, PhD;

This paper presents reliability life testing of trackers used by a Highly Concentrated Photovoltaic solar systems for power production ...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Weibull, Electronics

Reliability Prognostics for Electronics via Built-in Diagnostic Tools

by Tongdan Jin; Quan Sun; Peng Wang

This paper proposes an analytical model to characterize the system degradation and predict its remaining useful life based on self-diagn..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Electronics, Statistics, Reliability Analysis/Allocation/Prediction/Estimation

Development of Photonics Component Failure Rate Models

by Nicholls, David B. ; Mazurowski, John ; Hackert, Michael ; Avak, Anthony ;

This paper summarizes the results of three tasks: evaluate methods that could be used to predict the reliability of photonic com! ponents, define photonics component models and quantify the model parameters...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Electronics, Reliability Prediction, Failure Analysis, FMEA

Increasing The Reliability Of A Self-Optimizing Railway Guid. Sys.

by Sondermann-Wölke, Christoph; Sextro, Walter; Geisler, Jens;

Self-Optimizing methods were applied to a railway system to improve dependability and reliability. System performance was de! monstrated using a test track...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Reliability Model, Electronics, Software Reliability

SEU Concept to Reality (Allocation, Prediction, Mitigation)

by Bidokhti, Nematollah ;

SEUs are caused by either atmospheric neutrons or alpha particles emitted by trace impurities in the silicon processing and packaging materials. SEUs could cause single or multiple bit errors in the components such as ASCIs,FPGAs, processors and memories...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Event Tree, Software Reliability, Electronics

Revision of MIL-HDBK-217, Reliability Prediction of Electronic Equipment

by Jeffrey W. Harms;

This paper will discuss current efforts in the revision of MIL-HDBK-217, Military Handbook, Reliability Prediction of Electronic Equipment...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Reliability Prediction, Standards, Electronics

Effect of Solder Flux Residues on Corrosion of Electronics

by Stentoft, Kristen; Jellesen, Morten; Moller, Per; Westerman, Peter Jacob Schwenck

Flux from ‘No Clean’ solder processes can cause reliability problems in the field due to aggressive residues, which may be electrical conducting or corrosive in humid environments...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Failure Analysis, Electronics

Availability Analysis of a Solar Power System with Graceful Degradation

by Huffman, Duane; Antelme, France

In this paper, we show how to model this system using standard reliability block diagrams (RBDs) that support capacity. The proposed method is easily scalable for additional branches and microinverter units per branch...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Availability Model, Degradation, Electronics

Consideration for CDM breakdown and reliability designing in the latest semiconductor technology

by Wakai, Nobuyuki; Kobira, Yuji

According to the result of failure analysis for CDM failed semiconductor device, it was found that gate oxide breakdown was critical failure mode in CDM...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Design Reliability, Electronics, Engineering

Intermittent Faults and Effects on Reliability of Integrated Circuits

by Constantinescu, Cristian

Field collected data and failure analysis results presented in this paper clearly show intermittent faults are a major source of errors in modern integrated circuits...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Electronics, Failure Analysis

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