Library

Reliability Modeling of Transistor Gates at the Nanoscale

by Otieno, Wilkistar; Okogbaa, O. Geoffrey

Our work is an attempt to examine the feasibility of porting what works in the macro realm to the nano realm and specifically the reliability of high-k dielectric material..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Model, Degradation, Electronic Reliability

What’s Wrong With Bent Pin Analysis, And What To Do About It

by Ozarin, Nathaniel

It brings bent pin analysis into the 21st century..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Electronic Reliability, FMEA, Failure Analysis, Reliability Analysis/Prediction/Estimation

Embedded Diagnostics Enable Military Ground Vehicle Autonomic Logistics

by Banks, Jeffrey; Crow, Ed

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 06A: Health Management Systems - An. Moderator: Dennis R. Hoffman, Lockheed Martin Aeronautics...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Electronic Reliability, Warranty, Life Cycle Cost

Prognostics Implementation Methods for Electronics

by Gu, Jie; Vichare, Nikhil; Tracy, Terry; Pecht, Michael

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 07A: Health Management Systems - An Enabler to Mission Assurance. Moderator: Joseph A. Dzekevich, Raytheon...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Electronic Reliability, FMEA

Electronic Failures and Monitoring Strategies in Automotive Control Units

by Pickard, Karsten; Leopold, Tobias; Müller, Peter; Bertsches, Bernd

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 05A: Application of Design Optimization Techniques to Maximize Reliability and Maintainability. Moderator: Sean Carter, SRS Technologies...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Risk Assessment, FMEA, Electronic Reliability

Electronic Prognostics for Computer Servers

by Urmanov, Aleksey

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 06A: Health Management Systems - An. Moderator: Dennis R. Hoffman, Lockheed Martin Aeronautics...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Electronic Reliability, Reliability Model

Integrated Approach to Reliability-Based Design of Future Electronics Systems

by Nasser, Loren; Tryon, Robert; Rudy, Richard

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Electronic Reliability, Product Reliability

Memory Yield and Complexity of Built-in Self-Repair

by Wang, Xiaopeng; Mehler, Joel N.; Meyer, Fred J.; Park, Nohpill

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08A: Component Reliability. Moderator: Kenneth P. LaSala, KPL Systems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Electronic Reliability

The Value of Field Feedback in Consumer Electronics

by Petkova, Valia T.; Sander, Peter C.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07D: R, M & Q in Design. Moderator: Alan P. Wood, Sun Microsystems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Electronic Reliability, Failure Analysis, System Reliability

Minimize System Reliability Variability Based on Six-Sigma Criteria Considering Component Operational Uncertainties

by Jin, Tongdan; Su, Peter

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07D: R, M & Q in Design. Moderator: Alan P. Wood, Sun Microsystems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model , Electronic Reliability

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