Library

Optimization of the Test Stress Levels of an ADT

by Zheng-Zheng Ge; Xiao-Yang Li; Tong-Min Jiang; Jing-Rui Zhang;

This paper optimizes a design of an ADT by optimizing its stress levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Degradation, Monte Carlo Analysis, Process Design/Reliability

Equipment Degradation Monitoring for Sustained Reliability

by Sanjay K. Chaturvedi, PhD; Edwin Vijay Kumar D, PhD; A. Syam Sundar, PhD;

Process Equipment degradation monitoring model with condition monitoring data is proposed and the same is used to deve..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Failure Rate, Optimizing Equipment Maintenance, Degradation

Degradation test plan for Wiener degradation processes

by Paul Schimmerling; Mihaela Barreau-Guérin, Associate professor; Léo Gerville-Réache, Associate professor; Julien Baussaron, PhD student

The aim of this study is to design%! 20a degradation test plan that guarantees a given level of reliability for a new product using the experimental feedback...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Degradation, Reliability,Demonstration Tests

Step-Stress ADT Data Estimation based on Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

Product performance degradation data of Step-Stress Accelerated Degradation Testing (SSADT) is time series. Hence, a time series method is proposed to analyses SSADT data...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Statistics, Demonstration Tests, Degradation, HALT/HASS

Optimal Design for Step-Stress Accelerated Degradation Testing with Competing Failure Modes

by Li, Xiaoyang; Jiang, Tongmin

This optimal testing plan gives the optimal number of test units and inspection times at each stress level. Finally, we analyze the different optimal plans with different budgets, different levels of stress and different stress steps..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, FMEA, Fault Tree Analysis, Failure Rate

Validation of a Mechanical Component Constant Failure Rate Database

by Bukowski, Julia V.; Goble, William M.

This paper reports on our successful efforts to validate statistically certain constant failure rate data in a mechanical component constant failure rate and failure mode database..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Data Analysis, Degradation, Demonstration Tests, Failure Analysis

Availability Analysis of a Solar Power System with Graceful Degradation

by Huffman, Duane; Antelme, France

In this paper, we show how to model this system using standard reliability block diagrams (RBDs) that support capacity. The proposed method is easily scalable for additional branches and microinverter units per branch...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Availability Model, Degradation, Electronics

Life-Prediction of the CSADT Based on BP Algorithm of ANN

by Zhang, Wei; Jiang, Tongmin; Li, Xiaoyang

In this paper, a new model is developed to predict the life of items in the constant stress accelerated degradation testing (CSADT) based on Back- Propagation (BP) Algorithm of Artificial Neural Network (BPANN)...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, Monte Carlo Analysis, Networks

Product Robust Design via Accelerated Degradation Tests

by Sanches, Luis Mejia; Pan, Rong

In this paper, a methodology is developed for achieving product robust design via ADTs...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, Design Reliability

Impact of Proof Test Effectiveness on Safety Instrumented System Performance

by Bukowski, Julie V.; van Beurden, Iwan

This paper addresses the effectiveness of proof tests that are performed on safety instrumented functions (SIF) to reveal any failures undetected by automatic diagnostics...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Demonstration Tests, Reliability Model, Degradation

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