Library

System Reliability Assessment as Components Undergo Accelerated Testing

by Yuan-yuan Tan, PhD; Xun Chen, Professor; Wei Luo, PhD; Chun-hua Zhang, Associate Professor;

This paper proposes a feasible method to estimate system reliability as the..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Bayesian, Demonstration Tests

Practical Reliability Testing of Structures Under Road Loadings

by Julio Pulido, PhD;

Examples of mechanical structures under road and self-induced vibration are presented. Vibration testing planning using finite element techniques associated with several f..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Strength-Load, Product Design/Reliability

System Reliability Assessment as Components Undergo Accelerated Testing

by Yuan-yuan Tan, PhD; Xun Chen, Professor; Wei Luo, PhD; Chun-hua Zhang, Associate Professor;

This paper proposes a feasible method to estimate system reliability as the..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Bayesian, Monte Carlo Analysis

Optimization of the Test Stress Levels of an ADT

by Zheng-Zheng Ge; Xiao-Yang Li; Tong-Min Jiang; Jing-Rui Zhang;

This paper optimizes a design of an ADT by optimizing its stress levels...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Degradation, Monte Carlo Analysis, Process Design/Reliability

Reliability Assessment of High-Concentration Photovoltaic Trackers

by Jon G. Elerath, PhD;

This paper presents reliability life testing of trackers used by a Highly Concentrated Photovoltaic solar systems for power production ...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Weibull, Electronics

System Reliability Models with Stress Covariates for Changing Load Profiles

by Mark Agnello; Keith Megow; David Coit; Akira Hada;

New system reliability models are presented and demonstrated to anticipate system reliability and availability%..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,System Reliability, Strength-Load, Weibull, Accelerated Life Testing

Optimized Acoustic Microscopy Screening for Multilayer Ceramic Capacitors

by Schwartz, Stanley W.; Kostic, Andrew D.

An optimized acoustic microscopy screening process has been developed for multi layer ceramic chip capacitors that identifies potential early life failures for removal. Accelerated life testing has validated the effectiveness of the methodology...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Failure Analysis, Product Reliability

Pseudo-conjugated prior distribution for parametric ALT model

by Fabrice Guérin, Professor; Antoine Grall, Professor;

The study presents the construction of the prior distribution as a pseudo-conjugated form by simulation. The inte! rest of the procedure lays in the extended usage of the conjugate approach for multiple-parameter cases, as the ALT model...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Accelerated Life Testing, Bayesian, Demonstration Tests

Bayesian Planning of Optimal Step-Stress Accelerated Life Test

by Xi Liu; Tao Yuan, PhD

This study develops a method for planning optimal step-stress accelerated life test using the Bayesian approach...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Bayesian, Accelerated Life Testing, Weibull

CSADT Life Prediction based on DAD using Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

This paper proposes a new Constant-Stress ADT (CSADT) life prediction procedure based on DAD using a composite time series modeling procedure.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

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