Library

Modelling Imperfect Inspection and Maintenance in Defence Aviation Through Bayesian Analysis of the KIJIMA Type I General Renewal Process (GRP)

by Jacopino, Andrew; Groen, Frank; Mosleh, Ali

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. . Moderator: Edward J. Zampino, NASA Glenn...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Maintainability, Simulation

Specification and Allocation of Reliability and Availability Requirements

by Hagmark, Per-Erik; Virtanen, Seppo

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 08E: Operational Reliability Requirements and Optimization. Moderator: Todd Heydt, GE Healthcare...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Availability, Simulation

Reliability Analysis of Mechatronic Systems Using Censored Data and Petri Nets: Application on an Antilock Brake System (ABS)

by Richard Rudy

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,System Reliability, Simulation

Emerging Probabilistic Technology and Its Application to Reliability Prediction and Risk Assessment

by Khalessi, Mohammad R.; Lin, Hong-Zong; Kuper, Robert J.; D'Angelo, Antony

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, Simulation

Virtual Validation and Verification of a Product Specification

by Chang, Muchiu

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05A: Product Verification and Validation: When is Good, Good Enough?. Moderator: Ken Schmidt, Optim Associates...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Maintainability, Simulation, Life Cycle Cost

Reliability Analysis of Descent Systems of Planetary Vehicles Using Bivariate Exponential Distribution

by Sarper, Hüseyin

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07B: Modeling & Simulation of Reliability Performance. Moderator: O. Geoffrey Okogbaa, U. of South Florida...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,System Reliability, Monte Carlo Simulation

A State of Research Review on Fault Injection Techniques and a Case Study

by Yu, Yangyang; Johnson, Barry W.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 13B: Risk & Safety Management. Moderator: Steven Smith, FAA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Simulation, Statistics

A Machine Learning Approach to Estimate Frequency, Duration & Availability Indexes in Complex Networks

by Rocco, Claudio M.; Muselli, Marco

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Simulation, Networks

ATLAST Deployment & Push Pack Spares Optimization Module

by Gurvitz, Naaman; Borodetsky, Sergey; Eck, Pierre van

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 05D: Software Tools for R & M. Moderator: Liudong Xing, U. of Massachusetts...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Life Cycle Cost, Simulation, Markov

Early Reliability Prediction in Consumer Electronics Using Weibull Distribution Functions

by Ion, Roxana A.; Sander, Peter C.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 05B: Product Design & Assurance. Moderator: Richard J. Rudy, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Warranty; Weibull Analysis; Simulation

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