Library

Product Robust Design via Accelerated Degradation Tests

by Sanches, Luis Mejia; Pan, Rong

In this paper, a methodology is developed for achieving product robust design via ADTs...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, Design Reliability

Optimizing the Number of Failure modes for Design Analysis Based on Physics of Failure

by Loll, Valter

Design for reliability requires a different approach from Failure Reporting and Corrective Action System (FRACAS) and Test, Analyze and Fix (TAAF) both of which are tools for reliability improvement of already designed hardware..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Failure Analysis, Design Reliability, HALT/HASS, Accelerated Life Testing

Using Competitive Analysis to Get the Competitive Advantage

by Farel, Doug; Silverman, Mike Andrew

Using Competitive Analysis, we can determine areas of strength as well as areas of weakness so that we can develop aplan for reliability improvement...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Prediction, FMEA, Failure Mode and Effects Analysis, Accelerated Life Testing

A Methodology for Managing Reliability Growth during Operational Mission Profile Testing

by Crow, Larry H.

This paper presents a methodology currently being applied on major Department of Defense programs for operational reliability growth testing...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Testing, Reliability Growth, Reliability Management

Bayesian Inference Model for Step-Stress Accelerated Life Testing with Type-II Censoring

by Lee, Jinsuk; Pan, Rong

In this paper we present a Bayes inference model for a simple step-stress accelerated life test (SSALT) using type-II censored samples...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Accelerated Life Testing, Bayesian, Reliability Model

On Determining Sample Size and Testing Duration of Repairable System Test

by Guo, Huairui; Pan, Rong

This paper develops a theoretical method, based on pivotal quantities and a confidence bound requirement for the reliability metrics of interest, to help test planners to determine the minimal sample sizes and test duration..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Repairable Systems, Reliability Testing, Sample Size

Life Testing of Plastic Optical Fibers for Lead-Acid Battery Fast Charge Equipment

by Acevedo, Jorge Marcos; Cao Paz,Ana Maria; Fernandez-Gomez,Santiago; Soria, Maria Luisa

We present our results on accelerated tests using plastic fiber optics as sensing elements for electrolyte density...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Prediction, Accelerated Life Testing, Engineering

Efficiently represent diverse System Field Usage in Reliability Testing

by Sonnemans, Peter J.M.; Balasubramanian, Aravindan; Kevrekedis, Kostas; Newby, Martin J.

This paper addresses the problem how to represent diverse field usage of professional systems in an efficient way, so that field usage can be incorporated in reliability tests...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Testing, Engineering

Consideration of Burn-In Acceleration and Effective Screening Procedure in Latest System LSI

by Wakai, Nobuyuki; Kobira, Yuji; Egawa, Hidemitsu

An effective procedure to determine the Burn-In acceleration factors for latest System LSI (Large Scale Integration) with 90nm and 65nm technology are discussed in this paper...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Software Reliability, Accelerated Life Testing

How to Develop a Qualification Test Plan for RoHS Products

by Silverman, Mike Andrew; Schenkelberg, Fred; Hillman, Craig

The subject matter we consider in this paper are the significant reliability uncertainties around Lead-Free Solder and how to best consider these risks and mitigate them so as not to take a hit in the area of reliability during the lead-free transition...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,HALT/HASS, Accelerated Life Testing, Reliability Testing

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