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Reliability Test Procedures for Achieving Highly Robust Electronic

by Tekcan, Tarkan ; Kirişken, Barbaros ;

© 2010 IEEE.Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

Today’s consumer electronics market becomes highly competitive because of the increase on number of manufacturers and high consumer expectations. These competition causes dramatic cost decreasing. Each cost down work could cause very crucial reliability problems if it is not managed well. Also, consumers’ expectations about reliability of the products are increased. Reliable, trouble-free and robust products satisfy customer needs for a long time. These quality improvements increase sales, reduce rework and services costs, and obtain good brand reputation. However, the manufacturing costs will be increased if it is wanted to produce highly

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Failure Analysis, Process Design/Reliability

Temperature Acceleration Models in Reliability Predictions: Justification

by Franck Bayle; Adamantios Mettas

We propose some improvements on steady-state temperature accleration models in order to have some more realistic reliability predictions...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Failure Analysis, Reliability Model

Improved Reliability Testing with Multiaxial Electrodynamics

by Habtour, Ed ; Drake, Gary S. ; Dasgupta, Abhijit ; Choi, Cholmin; Al-Bassyiouni, Moustafa ;

This article describes the use of multi-axial dynamic shakers to improve product reliability during the%! 20design phase...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Design Reliability, Failure Analysis, Engineering, Accelerated Life Testing

Design of Step Stress Accelerated Test and Reliability Assessment for Quartz Flexible Accelerometers

by Yunxia Chen; Rui Kang; Huiguo Zhang;

This paper presents an approach of step
stress accelerated test for..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Monte Carlo Analysis, Reliability Analysis/Allocation/Prediction/Estimation

Development of an Acceleration Model for Subsea Pressure

by Tom Foley; Linda Malone; Amar Thiraviam

This paper presents the steps followed in the development of an acceleration model for subsea pressure effects on plastic materials...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Engineering, Reliability Model

Software Reliability Accelerated Testing Method Based on Mixed Testing

by Yumei Wu, PhD; Yongqi Zhang, MD; Minyan Lu, PhD;

Software reliability accelerated testing based on
mixed testing and improved software reliability model based..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Software Reliability, Accelerated Life Testing

Life and Reliability Forecasting of the CSADT using Support Vector

by Li, Xiaoyang ; Li, Shuzhen ; Jiang, Tongmin ;

In this paper, a new degradation prediction method based..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Reliability Analysis/Prediction/Estimation

Compliance Testing is NOT Reliability Testing

by Hegde, Vaishali

The healthcare industry is expanding rapidly. This has led to a common (mis)belief, FDA mandated compliance testing, ensures a reliable product. This paper outlines the differences between compliance and reliability testing, with real life examples...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Product Reliability

Financial-Oriented Approach for the Allocation of Reliability Budgets

by Mannhart, Alexandra; Dittrich, Andre; Bertsche, Bernd

This article presents a concept for the allocation of test budgets and the determination of financial optimal reliability target settings for the non-safety case...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Analysis/Availability/Prediction/Estimation, Reliability Testing, R&M Modeling and Optimization

Worst-Case Prediction using the Arrhenius Model

by Yu, Yangyang (Charlotte); Chen, Felix

We present in this paper an Arrhenius-based method of assessing MTTF as applied to one of our own products...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Reliability Model

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