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Reliability Analysis of Warm Standby Systems using Sequential BDD

by Xing, Liudong; Tannous, Ola; Dugan, Joanne Bechta

A sequential binary decision diagrams (SBDD) based approach is proposed for the reliability analysis of warm standby sparing systems. Basics of the proposed method and its advantages over existing approaches will be illustrated through several examples..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

Lithium Battery Analysis: Probability of Failure Assessment Using Logistic Regression

by Moebes, Travis A;

A Logistic Regression model was used to find helpful predictors for detecting “good” or “bad” cells in a large collection of lithium-ion battery cells...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation

Impact of Information on the Quality of a Prognosis Indicator

by Lorton, Ariane; Grall, Antoine; Fouladirad, Mitra

A method for quantifying the impact of available information on the prediction of Remaining Useful Life is discussed and illustrated by an aeronautic example...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation

Equipment Health Management through Information Fusion for Reliability

by Kumar, Edwin Vijay; Chaturvedi, S. K.

The information fusion is of paramount importance to strengthen the mainten! ance management in process industries using condition monitoring data and qualitative expert domain knowledge...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Analysis/Prediction/Estimation

A Practical Method for Reliability Analysis of Phased-Mission Systems

by Amari, Suprasad V.

This paper presents a practical and computationally efficient method for ac! curate reliability analysis of phased-mission systems...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation

Reliability and Maintainability in Photovoltaic Inverter Design

by Thomas, Spyros; Ma, Zhiqiang Janet

Reliability and maintainability in the PV inverter design will be discussed with the emphasis on worst case analysis, component sizing and useful life analysis...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Maintainability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation

Efficient Analysis of Imperfect Coverage Systems with Functional Dependence

by Liudong, Xing; Dugan, Joanne Bechta; Morrissette, Brock A.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-11
  • Keywords:RAMS 2010 Proceedings, Product Development, Process Reliability, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation, Software Reliability, Systems Engineering

Two Recommendations for the Acquisition and Growth of Reliable Systems

by Paul Lein; David B. Nicholls;

This paper presents recommendations for improving the acquisition of reliable systems: use a metric called Historical Observed Reliability Ratio and extend the classifications of failures to include Unanticipated Failure Mode and Unexpected Failure Mode...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Failure Analysis, Reliability Growth, Reliability Prediction

Enhancing MIL-HDBK-217 Reliability Predictions with Physics of Failure Methods

by James G. McLeish;

This paper reviews the concepts on how PoF methods can co-exist with empirical prediction techniques in MIL-HDBK-217...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Failure Analysis, Reliability and Availability Assessment, Reliability Prediction Design Reliability, Standards

Development of Photonics Component Failure Rate Models

by Nicholls, David B. ; Mazurowski, John ; Hackert, Michael ; Avak, Anthony ;

This paper summarizes the results of three tasks: evaluate methods that could be used to predict the reliability of photonic com! ponents, define photonics component models and quantify the model parameters...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Electronics, Reliability Prediction, Failure Analysis, FMEA

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