Library

An ADT Data Evaluation Method of SLD Based on Bayesian Theory

by Xiaoyang Li; Tongmin Jiang; Lizhi Wang; Junbo Wan

SLD is widely applied in the areas of optical fiber sensors, optical fiber communication systems, coherent optical photographic systems, clinical systems and so on.
..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Software Reliability Model with Bathtub-shaped Fault Detection Rate

by Swapna S. Gokhale, PhD; Lance Fiondella

Software does not wear out physically like hardware, which is directly subjected to mechanical and electrical stress through its lifetime. A thoroughly tested program should perform as required, assuming that its operating environment does not change...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Software Reliability

Planning a Reliability Growth Program Utilizing Historical Data

by Larry H. Crow, Ph.D

For many years prior to the Department of Def..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Birnbaum Importance in Solving Component Assignment Problems

by Xiaoyan Zhu, PhD; Way Kuo, PhD; Qingzhu Yao

As an important type of reliability optimization problems, the component assignment problem (CAP) is to find the optimal arrangement of n available components to n positions of a system such that the resulting system reliability is maximized...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Block Diagram, Reliability Model, Reliability Analysis/Prediction/Estimation, Design Reliability

Modeling Science Objectives within a Probabilistic Risk Assessment

by Smith, Clayton; Kubota, Sanae; Jones, Melissa; Fretz, Kristin

This paper discusses modeling aspects of the Radiation Belt Storm Probes (RBSP) science objectives..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

Soft Error Trends and Mitigation Techniques in Memory Devices

by Charles Slayman;

As various system technologies scale to larger device complexity and higher%2..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

Evaluating downtime and maintenance time in communication networks

by Matsukawa, Tatsuya; Koshiji, Kohjun; Funakoshi, Hiroyuki

In this paper a method for evaluating maintainability in communication networks is described...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability

Fault Tree Analysis Using Stochastic Logic: A Reliable and High Speed Computing

by Zarandi, Hamid R.; Aliee, Hananeh

This paper introduces a new approach to analyzing fault trees based on stochastic logic...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

Reliability Analysis of Warm Standby Systems using Sequential BDD

by Xing, Liudong; Tannous, Ola; Dugan, Joanne Bechta

A sequential binary decision diagrams (SBDD) based approach is proposed for the reliability analysis of warm standby sparing systems. Basics of the proposed method and its advantages over existing approaches will be illustrated through several examples..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

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