Library

Equipment Degradation Monitoring for Sustained Reliability

by Sanjay K. Chaturvedi, PhD; Edwin Vijay Kumar D, PhD; A. Syam Sundar, PhD;

Process Equipment degradation monitoring model with condition monitoring data is proposed and the same is used to deve..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Failure Rate, Optimizing Equipment Maintenance, Degradation

System Reliability Models with Stress Covariates for Changing Load Profiles

by Mark Agnello; Keith Megow; David Coit; Akira Hada;

New system reliability models are presented and demonstrated to anticipate system reliability and availability%..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,System Reliability, Strength-Load, Weibull, Accelerated Life Testing

Impact of Ammunition Performance On Weapon Reliability & Life Cycle Cost

by Sandy Sheng;

Using failure trend analysis and historical data to identify cartridge effect on weapon reliability and life cycle cost...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Support Costs, Life Cycle Cost, Reliability Analysis/Allocation/Prediction/Estimation

Reliability Growth Test Design – Connecting Math to Physics

by Milena Krasich P. E

The paper describes a methodology for modeling reliability improvement test strategies to apply physics of failure and cumulative damage models with the related mathematics, and correlate tests to the product use in life...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability Growth, Failure Analysis, Reliability Model, Strength-Load

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Model

The Web-Accessible Repository of Physics-based Models (WARP)

by David Nicholls, CRE; Aaron Riesbeck;

The current trend in systems engineeri..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model

Reliability Predictions to Support a Design For Reliability Program

by Lori E. Bechtold;

Industry and the DoD are working together to revamp reliability prediction processes so that they provide the needed information to the design process in a timely fashion as well as provide relevant information for decisions in testing and sustainable......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Failure Analysis, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Integrated Developmental and Operational Testing To Evaluate Reliability

by Sullivan,Richards; Krolweski, Jane; Harpel,Beth

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Reliability and Availability Assessment, Failure Analysis, Reliability Analysis/Prediction/Estimation

Optimized Acoustic Microscopy Screening for Multilayer Ceramic Capacitors

by Schwartz, Stanley W.; Kostic, Andrew D.

An optimized acoustic microscopy screening process has been developed for multi layer ceramic chip capacitors that identifies potential early life failures for removal. Accelerated life testing has validated the effectiveness of the methodology...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Failure Analysis, Product Reliability

Improving Software-Based System R&M with Better Error Processing

by Nathaniel W. Ozarin

Improved use of error detection and reporting can greatly approve system reliability, safety, and maintainability...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings,Software Reliability, Process Management, Data Analysis

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